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Laboratory of Physics of Nanostructures

Laboratory of Physics of Nanostructures specializes in its research and teaching in materials science and the physics of low-dimensional structures and their applications. In addition, the laboratory has very good engineering and technological competence.

 

Main directions of research

  • Nanotribology (or nanoparticle interactions)
  • Material technology (we study thermoplastics and wood - for example plywood)
  • Surface treatment (coating of wood and metal with various functional films)

 

Cooperation

Laboratory of Physics of Nanostructures has different partners both inside and outside of the institute: Laboratory of Laser Spectroscopy, Laboratory of X-Ray Spectroscopy, Institute of Chemistry, Institute of Technology, TalTech. Entrepreneurial co-operation is also actively pursued (e.g. Andrese Klaasi AS, Otepää Kymmene OÜ, KuMa Wood OÜ, Nordfix OÜ).

 

 

Rünno Lõhmus
Associate professor in Materials Science
E-mail: runno.lohmus@ut.ee

 

 

 

Kristjan Saal
Associate professor in Materials Science
E-mail: kristjan.saal@ut.ee

 

 

 

Sergei Vlassov
Associate professor in Materials Science
E-mail: sergei.vlassov@ut.ee

 

 

 

Sven Oras
Research Fellow in nanomanipulations
E-mail: sven.oras@ut.ee

 

 

 

Madis Lobjakas
Engineer
E-mail: madis.lobjakas@ut.ee

 

PRG1198 "Development of laser-based pen-type probe-MS system for the analysis of cultural heritage objects (1.01.2021−31.12.2025)", Signe Vahur, University of Tartu, Faculty of Science and Technology, Institute of Chemistry.

PLTFYARENG53 "Development of antimicrobial surface coatings tested in real-life conditions into pilot production phase (18.02.2021−31.12.2021)", Vambola Kisand, University of Tartu, Faculty of Science and Technology, Institute of Physics.

LLTFY21434 (2014-2020.4.02.21-0348) "Reusable monopolymeric plastic packages (1.07.2021−27.12.2023)", Sven Lange, University of Tartu, Faculty of Science and Technology, Institute of Physics.

Scanning electron microscope Nova NanoSEM 450 (FEI)

  • Resolution 1.4 nm.
  • Can be used to measure in low-vacuum regime and visualize non-conducting samples (glasses, ceramics, wood).
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Scanning electron microscope Vega II SBU (Tescan)

  • Useful for quick visualization of samples; ideal for fast characterization of the surface features of samples (cracks, surface roughness); does not have high resolution.
  • Easy to use, good for learning the basics of electron microscopy.
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Atomic Force Microscope Dimension Edge (Veeco)

  • This device allows high resolution with conducting and non-conducting samples.
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Buehler Beta Grinder Polisher

  • Can be used for polishing of the samples to desired surface roughness.
  • Useful for preparation of samples for microscopy when it is necessary to examine the interior of a delicate test object (biological tissue, fragile minerals) The test object is immersed in a two-component polymer (epoxy) and after the hardening of polymer, sanded to the desired surface roughness. The obtained cross-section allows to visualize the inside of the test object (optical, atomic force, electron microscopy).
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Doctoral Defence: Juhan Saaring „Ultrafast relaxation processes in ternary hexafluorides studied under synchrotron radiation excitation“

Doctoral Defence: Juhan Saaring „Ultrafast relaxation processes in ternary hexafluorides studied under synchrotron radiation excitation“
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Doctoral defence: Ott Rebane „In situ non-contact sensing of microbiological contamination by fluorescence spectroscopy“

Doctoral defence: Ott Rebane „In situ non-contact sensing of microbiological contamination by fluorescence spectroscopy“
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07.08.2022
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Doctoral defence: Heido Trofimov „Polluted clouds at air pollution hot spots help to better understand anthropogenic impacts on Earth’s climate“

Doctoral defence: Heido Trofimov „Polluted clouds at air pollution hot spots help to better understand anthropogenic impacts on Earth’s climate“
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02.08.2022